Contact resistivity and more

The probe heads for the right arm are changed within seconds and recognized by the software. Available models are:

  • Custom-designed probe head for TLM test patterns
  • Adjustable head for solar cell stripes with finger spacing down to 1.2 mm
  • Line resistance head adjustable between 22 mm and 70 mm
  • Four-point-probe head for sheet resistance of diffused wafers with round tungsten-carbide tips
  • Four-point-probe head for resistivity with sharp tungsten-carbide tips and larger spacing.