Contact resistivity and more
This compact instrument measures
contact resistivity,
finger line resistance,
finger width, and
finger height
of a finished solar cell or on test structures.
Motorized in all axes it is capable of creating maps of all these methods by pushing a single button.
Four point probe
heads for measuring the sheet resistance of thin diffused layers and resistivity of wafers make the TLM-SCAN+ a low-cost yet fast and high-quality four-point-probe mapper.
