Contact resistivity and more

This compact instrument measures contact resistivity, finger line resistance, finger width, and finger height of a finished solar cell or on test structures.

Motorized in all axes it is capable of creating maps of all these methods by pushing a single button.

Four point probe heads for measuring the sheet resistance of thin diffused layers and resistivity of wafers make the TLM-SCAN+ a low-cost yet fast and high-quality four-point-probe mapper.