Four-point-probe mapping
This compact instrument is motorized in all axes to create mappings of sheet resistance and wafer resistivity with 100 points in less than 4 minutes. Single points can be re-measured after navigating the probe head to the desired location with a click on the map.
The four-point-probe is also available in combination with other measurement methods in the
TLM-SCAN+.
NOW ALSO AVAILABLE WITH HANDLING SYSTEM
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